#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212647
Mfr serial number	STN13601-12647

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212647

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16029
I_LEAK350V (microA)	0.2125
Substr Origin	317
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	65.9
20	88.22
30	101.25
40	111.7
50	119.7
60	125.61
70	130.4
80	134.8
90	138.99
100	142.95
110	146.7
120	150.25
130	153.77
140	157.04
150	160.29
160	163.38
170	166.39
180	169.3
190	172.21
200	175.08
210	177.93
220	180.7
230	183.4
240	185.9
250	188.5
260	191.1
270	193.6
280	196
290	198.4
300	200.9
310	203.2
320	205.6
330	207.9
340	210.2
350	212.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2892.58
30	2496.96
35	2217.86
40	2011.23
45	1850.79
50	1722.78
55	1620.62
60	1542.71
65	1487.97
70	1453.64
75	1434.35
80	1424.4
85	1419.38
90	1416.63
95	1414.81
100	1413.56
105	1412.57
110	1411.82
115	1411.04
120	1410.38

#End of manufacturer data file