#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212760
Mfr serial number	STN13607-12760

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212760

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.08863
I_LEAK350V (microA)	0.12476
Substr Origin	318
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.29
20	41.95
30	48.01
40	53.16
50	57.73
60	61.57
70	64.99
80	68.37
90	71.78
100	75.02
110	78.09
120	80.89
130	83.66
140	86.19
150	88.63
160	90.98
170	93.29
180	95.45
190	97.56
200	99.65
210	101.67
220	103.63
230	105.44
240	107.19
250	108.97
260	110.72
270	112.38
280	114.02
290	115.59
300	117.21
310	118.8
320	120.3
330	121.81
340	123.36
350	124.76
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2650.37
35	2352.29
40	2130.62
45	1958.99
50	1821.24
55	1708.53
60	1615.74
65	1541.45
70	1486.52
75	1449.81
80	1428.04
85	1416.36
90	1410.24
95	1407.07
100	1405.09
105	1403.77
110	1402.84
115	1402.06
120	1401.17

#End of manufacturer data file