#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212768
Mfr serial number	STN13596-12768

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212768

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.10615
I_LEAK350V (microA)	0.15698
Substr Origin	308
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	75
R Bias Upper (MOhm)	1.34
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.34
20	48.62
30	56.08
40	61.94
50	67.4
60	72.25
70	76.6
80	80.95
90	85.09
100	89.09
110	92.8
120	96.34
130	99.81
140	103.08
150	106.15
160	109.29
170	112.38
180	115.27
190	118.12
200	120.92
210	123.71
220	126.39
230	128.98
240	131.59
250	134.06
260	136.53
270	139
280	141.3
290	143.68
300	145.95
310	148.26
320	150.45
330	152.65
340	154.92
350	156.98
	
#CV	
10	
15	O.L.
20	O.L.
25	2954.41
30	2546.78
35	2259.02
40	2046.21
45	1881.91
50	1751.07
55	1646.71
60	1566.44
65	1508.35
70	1469.63
75	1446.46
80	1434.07
85	1427.67
90	1424.22
95	1422.09
100	1420.65
105	1419.81
110	1418.8
115	1417.81
120	1417.21

#End of manufacturer data file