#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212770
Mfr serial number	STN13596-12770

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212770

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11058
I_LEAK350V (microA)	0.16332
Substr Origin	308
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	75
R Bias Upper (MOhm)	1.34
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	757																																							
Pinhole	758																																							
Pinhole	759																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	36.03
20	49.57
30	57.46
40	64.08
50	69.61
60	74.68
70	79.43
80	83.98
90	88.36
100	92.51
110	96.41
120	100.13
130	103.68
140	107.23
150	110.58
160	113.82
170	117.04
180	120.1
190	123.09
200	126.03
210	128.94
220	131.67
230	134.37
240	137.03
250	139.65
260	142.24
270	144.74
280	147.2
290	149.58
300	151.97
310	154.3
320	156.59
330	158.84
340	161.13
350	163.32
	
#CV	
10	
15	O.L.
20	O.L.
25	2961.59
30	2552.78
35	2264.18
40	2051.06
45	1886.46
50	1755.35
55	1649.8
60	1568.39
65	1509.48
70	1471.02
75	1448
80	1435.93
85	1429.59
90	1426.51
95	1424.45
100	1423.19
105	1422.06
110	1421.25
115	1420.35
120	1419.66

#End of manufacturer data file