#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212777
Mfr serial number	STN13596-12777

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212777

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.1111
I_LEAK350V (microA)	0.16631
Substr Origin	308
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	75
R Bias Upper (MOhm)	1.34
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.65
20	49.55
30	57.32
40	63.39
50	68.74
60	73.88
70	78.78
80	83.61
90	88.18
100	92.53
110	96.52
120	100.38
130	104.12
140	107.57
150	111.1
160	114.47
170	117.76
180	120.93
190	124.01
200	127.04
210	130.05
220	132.93
230	135.76
240	138.51
250	141.24
260	143.97
270	146.62
280	149.21
290	151.75
300	154.31
310	156.78
320	159.21
330	161.61
340	164
350	166.31
	
#CV	
10	
15	O.L.
20	O.L.
25	2919.53
30	2514.9
35	2230.71
40	2018.45
45	1855.8
50	1726.44
55	1623.61
60	1546.14
65	1492.58
70	1459.76
75	1441.1
80	1431.57
85	1426.56
90	1423.51
95	1421.73
100	1420.25
105	1419.12
110	1418.21
115	1417.31
120	1416.67

#End of manufacturer data file