#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212779
Mfr serial number	STN13596-12779

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212779

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.10066
I_LEAK350V (microA)	0.15058
Substr Origin	308
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	75
R Bias Upper (MOhm)	1.34
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open	760																																							

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.54
20	45.12
30	52.15
40	57.74
50	62.54
60	67.19
70	71.61
80	75.88
90	80
100	83.86
110	87.49
120	90.96
130	94.34
140	97.56
150	100.66
160	103.67
170	106.69
180	109.53
190	112.31
200	115.06
210	117.8
220	120.42
230	123
240	125.51
250	127.99
260	130.48
270	132.88
280	135.25
290	137.49
300	139.81
310	141.99
320	144.16
330	146.33
340	148.51
350	150.58
	
#CV	
10	
15	O.L.
20	O.L.
25	2968.89
30	2557.85
35	2269.2
40	2053.69
45	1887.33
50	1755.14
55	1648.83
60	1566.62
65	1507.47
70	1468.98
75	1446.13
80	1433.87
85	1427.42
90	1424.03
95	1422.05
100	1420.76
105	1419.5
110	1418.49
115	1417.83
120	1416.96

#End of manufacturer data file