#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212799
Mfr serial number	STN13596-12799

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212799

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.12429
I_LEAK350V (microA)	0.1886
Substr Origin	308
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	75
R Bias Upper (MOhm)	1.34
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.05
20	54.71
30	63.44
40	70.4
50	76.79
60	82.56
70	87.93
80	93.17
90	98.23
100	103.07
110	107.62
120	111.96
130	116.27
140	120.34
150	124.29
160	128.14
170	131.75
180	135.56
190	139.12
200	142.6
210	146.09
220	149.46
230	152.77
240	155.99
250	159.14
260	162.27
270	165.34
280	168.37
290	171.32
300	174.34
310	177.27
320	180.14
330	183
340	185.8
350	188.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2923.75
30	2516.06
35	2229.67
40	2016.32
45	1852.77
50	1723.46
55	1621.45
60	1545.44
65	1492.85
70	1459.95
75	1441.18
80	1431.43
85	1426.43
90	1423.82
95	1421.95
100	1420.63
105	1419.72
110	1418.76
115	1417.9
120	1417.35

#End of manufacturer data file