#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212966
Mfr serial number	STN13766-12966

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212966

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.11538
I_LEAK350V (microA)	0.16742
Substr Origin	324
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	80
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.41

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.55
20	56.07
30	64.61
40	71.18
50	76.52
60	81.2
70	85.59
80	89.87
90	94.03
100	97.98
110	101.8
120	105.31
130	108.9
140	112.16
150	115.38
160	118.47
170	121.55
180	124.48
190	127.33
200	130.16
210	132.98
220	135.66
230	138.35
240	140.91
250	143.52
260	146.1
270	148.59
280	151.1
290	153.51
300	155.96
310	158.33
320	160.63
330	162.93
340	165.15
350	167.42
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2749.11
35	2438.89
40	2208.11
45	2026.93
50	1883.61
55	1765.21
60	1666.66
65	1585.89
70	1523.65
75	1480.1
80	1453.02
85	1438.16
90	1430.56
95	1426.81
100	1424.63
105	1423.07
110	1421.78
115	1420.81
120	1420.08

#End of manufacturer data file