#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212994
Mfr serial number	STN13767-12994

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212994

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10254
I_LEAK350V (microA)	0.14634
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	85
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.83
20	49.39
30	57.02
40	63.02
50	68.24
60	72.88
70	76.89
80	80.55
90	84.03
100	87.49
110	90.72
120	93.84
130	96.85
140	99.73
150	102.54
160	105.19
170	107.85
180	110.39
190	112.81
200	115.24
210	117.67
220	119.92
230	122.18
240	124.4
250	126.63
260	128.77
270	130.9
280	132.99
290	134.91
300	136.9
310	138.87
320	140.76
330	142.57
340	144.49
350	146.34
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2831.1
35	2510.38
40	2270.29
45	2085.45
50	1937.38
55	1815.01
60	1712.91
65	1627.32
70	1557.55
75	1504.6
80	1467.9
85	1444.69
90	1431.1
95	1423.85
100	1420.06
105	1417.9
110	1416.51
115	1415.49
120	1414.52

#End of manufacturer data file