#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212995
Mfr serial number	STN13767-12995

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212995

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12176
I_LEAK350V (microA)	0.1809
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	85
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.36
20	56.85
30	66.01
40	73.28
50	79.66
60	85.09
70	89.79
80	94.16
90	98.47
100	102.68
110	106.73
120	110.62
130	114.48
140	118
150	121.76
160	125.28
170	128.75
180	132.1
190	135.35
200	138.59
210	141.86
220	144.97
230	148.04
240	151.07
250	154.07
260	157.09
270	160.04
280	162.93
290	165.66
300	168.28
310	170.73
320	173.4
330	175.96
340	178.31
350	180.9
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2809.18
35	2487.91
40	2247.81
45	2062.69
50	1914.69
55	1792.72
60	1691.2
65	1606.34
70	1538.3
75	1488.2
80	1454.47
85	1433.97
90	1422.68
95	1416.68
100	1413.41
105	1411.67
110	1410.28
115	1409.4
120	1408.42

#End of manufacturer data file