#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212997
Mfr serial number	STN13767-12997

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212997

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10109
I_LEAK350V (microA)	0.14641
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	85
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.15
20	47.41
30	54.83
40	60.77
50	66.05
60	70.79
70	74.85
80	78.55
90	82.16
100	85.66
110	88.94
120	92.16
130	95.31
140	98.23
150	101.09
160	103.84
170	106.56
180	109.17
190	111.7
200	114.19
210	116.69
220	119.06
230	121.41
240	123.7
250	125.96
260	128.24
270	130.41
280	132.51
290	134.61
300	136.67
310	138.67
320	140.62
330	142.57
340	144.53
350	146.41
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2830.22
35	2508.87
40	2268.32
45	2082.85
50	1934.52
55	1812.05
60	1709.79
65	1624.02
70	1554.29
75	1501.1
80	1463.82
85	1439.57
90	1425.25
95	1417.56
100	1413.24
105	1410.89
110	1409.35
115	1408.15
120	1407.1

#End of manufacturer data file