#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212998
Mfr serial number	STN13767-12998

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212998

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11573
I_LEAK350V (microA)	0.17429
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	80
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.15
20	53.02
30	61.39
40	68.07
50	74.14
60	79.34
70	83.97
80	88.42
90	92.79
100	96.99
110	100.97
120	104.81
130	108.61
140	112.2
150	115.73
160	119.15
170	122.55
180	125.65
190	128.99
200	132.15
210	135.29
220	138.34
230	141.33
240	144.29
250	147.18
260	150.11
270	152.93
280	155.7
290	158.4
300	161.13
310	163.81
320	166.44
330	169.1
340	171.69
350	174.29
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2647.01
35	2346.96
40	2122.66
45	1949.98
50	1811.84
55	1698.53
60	1606.73
65	1535.79
70	1485.51
75	1453.43
80	1434.8
85	1425.06
90	1420.26
95	1417.49
100	1415.81
105	1414.53
110	1413.52
115	1412.71
120	1411.95

#End of manufacturer data file