#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213002
Mfr serial number	STN13767-13002

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213002

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.0952
I_LEAK350V (microA)	0.13935
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	80
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.96
20	45.07
30	51.87
40	57.19
50	61.99
60	66.17
70	69.83
80	73.43
90	76.94
100	80.38
110	83.59
120	86.67
130	89.69
140	92.51
150	95.2
160	97.92
170	100.53
180	103.1
190	105.55
200	107.98
210	110.35
220	112.67
230	114.92
240	117.08
250	119.26
260	121.46
270	123.53
280	125.6
290	127.64
300	129.67
310	131.67
320	133.58
330	135.53
340	137.47
350	139.35
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2691.66
35	2386.75
40	2158.7
45	1983.04
50	1842.37
55	1726.68
60	1631.22
65	1553.91
70	1496.51
75	1458.36
80	1436.12
85	1424.52
90	1418.71
95	1415.62
100	1413.8
105	1412.34
110	1411.42
115	1410.52
120	1409.68

#End of manufacturer data file