#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213004
Mfr serial number	STN13767-13004

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213004

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12103
I_LEAK350V (microA)	0.17922
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	85
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.44
20	56.44
30	65.34
40	72.77
50	78.9
60	84.01
70	88.59
80	93.04
90	97.43
100	101.8
110	105.92
120	109.81
130	113.54
140	117.4
150	121.03
160	124.56
170	128.06
180	131.39
190	134.62
200	137.81
210	140.95
220	143.97
230	146.91
240	149.8
250	152.68
260	155.55
270	158.33
280	161.07
290	163.76
300	166.45
310	169.13
320	171.71
330	174.12
340	176.67
350	179.22
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2759.66
35	2445.19
40	2211.36
45	2030.93
50	1886.71
55	1767.63
60	1668.8
65	1587.71
70	1524.39
75	1478.93
80	1449.5
85	1432.83
90	1424.07
95	1419.57
100	1417.2
105	1415.54
110	1414.38
115	1413.45
120	1412.63

#End of manufacturer data file