#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213005
Mfr serial number	STN13767-13005

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213005

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11206
I_LEAK350V (microA)	0.16584
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.03
20	52.38
30	60.33
40	66.84
50	72.6
60	77.41
70	81.72
80	85.96
90	90.14
100	94.17
110	97.99
120	101.65
130	105.28
140	108.72
150	112.06
160	115.28
170	118.47
180	121.54
190	124.5
200	127.42
210	130.4
220	133.24
230	136.01
240	138.67
250	141.32
260	143.95
270	146.52
280	149.05
290	151.53
300	154.02
310	156.45
320	158.6
330	161.17
340	163.54
350	165.84
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2585.56
35	2291.88
40	2075.28
45	1907.4
50	1773.23
55	1663.7
60	1575.97
65	1510.09
70	1465.59
75	1439.13
80	1425.14
85	1418.46
90	1415.13
95	1413.07
100	1411.66
105	1410.63
110	1409.76
115	1408.98
120	1408.13

#End of manufacturer data file