#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213007
Mfr serial number	STN13767-13007

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213007

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.09649
I_LEAK350V (microA)	0.14004
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	80
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.31
20	45.48
30	52.4
40	58.04
50	63.16
60	67.45
70	71.2
80	74.79
90	78.28
100	81.68
110	84.85
120	87.91
130	90.9
140	93.73
150	96.49
160	99.17
170	101.82
180	104.37
190	106.87
200	109.24
210	111.58
220	113.87
230	116.08
240	118.26
250	120.43
260	122.58
270	124.64
280	126.66
290	128.65
300	130.65
310	132.48
320	134.47
330	136.33
340	138.21
350	140.04
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2675.97
35	2373.26
40	2148.26
45	1974.49
50	1835.42
55	1721.09
60	1627.04
65	1552.49
70	1498.44
75	1463.47
80	1442.93
85	1431.96
90	1426.18
95	1423.27
100	1421.33
105	1420.17
110	1419.02
115	1418.14
120	1417.49

#End of manufacturer data file