#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213026
Mfr serial number	STN13770-13026

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213026

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13143
I_LEAK350V (microA)	0.1972
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	80
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.42
20	59.61
30	69
40	76.29
50	82.35
60	87.8
70	93.3
80	98.9
90	104.36
100	109.54
110	114.32
120	118.83
130	123.32
140	127.44
150	131.43
160	135.36
170	139.24
180	142.84
190	146.57
200	150.08
210	153.65
220	157.03
230	160.33
240	163.63
250	166.88
260	170.13
270	173.26
280	176.34
290	179.46
300	182.6
310	185.6
320	188.5
330	191.5
340	194.4
350	197.2
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2693.69
35	2388.52
40	2162.26
45	1984.1
50	1843.41
55	1727.82
60	1633.12
65	1557.41
70	1501.42
75	1464.63
80	1442.59
85	1430.32
90	1423.57
95	1419.86
100	1417.61
105	1416.07
110	1414.99
115	1413.94
120	1412.94

#End of manufacturer data file