#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213229
Mfr serial number	STN13775-13229

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	05/12/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213229

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14472
I_LEAK350V (microA)	0.2204
Substr Origin	329
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	95
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.75
20	65.23
30	76.37
40	85.28
50	92.81
60	99.28
70	104.82
80	110.13
90	115.22
100	120.54
110	125.61
120	130.76
130	135.41
140	140.1
150	144.72
160	148.81
170	153.4
180	157.63
190	161.91
200	165.97
210	170.24
220	174.05
230	178.08
240	181.9
250	186.1
260	189.7
270	193.6
280	197.1
290	200.7
300	204.4
310	207.8
320	211.3
330	214.4
340	217.5
350	220.4
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2989.87
35	2652.07
40	2399.05
45	2200.54
50	2043.15
55	1913.93
60	1805.6
65	1712.98
70	1634.17
75	1568.07
80	1515.08
85	1475.89
90	1449.58
95	1432.92
100	1423.22
105	1417.84
110	1414.94
115	1413.23
120	1412.08

#End of manufacturer data file