#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213484
Mfr serial number	STN14167-13484

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	07/01/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213484

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.08009
I_LEAK350V (microA)	0.11834
Substr Origin	333
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	27.71
20	37.43
30	42.71
40	46.98
50	50.6
60	53.97
70	57.28
80	60.59
90	63.81
100	66.89
110	69.81
120	72.56
130	75.13
140	77.56
150	80.09
160	82.46
170	84.67
180	86.94
190	89.11
200	91.15
210	93.34
220	95.33
230	97.23
240	99.13
250	101.1
260	102.95
270	104.86
280	106.59
290	108.37
300	110.07
310	111.83
320	113.55
330	115.23
340	116.73
350	118.34
	
#CV	
10	
15	O.L.
20	O.L.
25	2830.26
30	2440.88
35	2167.26
40	1964.33
45	1807.36
50	1682.77
55	1585.41
60	1514.08
65	1466.33
70	1437.65
75	1422.2
80	1414.28
85	1410.21
90	1407.87
95	1406.3
100	1405.07
105	1404.05
110	1403.36
115	1402.57
120	1401.81

#End of manufacturer data file