#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213485
Mfr serial number	STN14167-13485

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	07/01/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213485

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.07988
I_LEAK350V (microA)	0.11712
Substr Origin	333
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	27.3
20	36.91
30	42.18
40	46.45
50	50.19
60	53.64
70	57.07
80	60.42
90	63.69
100	66.76
110	69.66
120	72.47
130	75.03
140	77.41
150	79.88
160	82.13
170	84.39
180	86.6
190	88.71
200	90.73
210	92.83
220	94.82
230	96.78
240	98.68
250	100.52
260	102.34
270	103.97
280	105.82
290	107.56
300	109.2
310	110.83
320	112.37
330	114.05
340	115.55
350	117.12
	
#CV	
10	
15	O.L.
20	O.L.
25	2865.86
30	2473.82
35	2198.24
40	1992.99
45	1834.14
50	1708.29
55	1609.25
60	1535.24
65	1483.96
70	1451.34
75	1432.27
80	1422.02
85	1416.81
90	1414.02
95	1412.21
100	1410.94
105	1409.84
110	1409.02
115	1408.21
120	1407.52

#End of manufacturer data file