#General information ITEM section %ITEM SERIAL NUMBER 20220900213536 Mfr serial number STN14168-13536 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 20/01/2003 PROBLEM NO PASSED YES Run number 20220900213536 #Test data Data section %DATA TEMPERATURE (C) 27 I_LEAK150V (microA) 0.10855 I_LEAK350V (microA) 0.1626 Substr Origin 333 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 289 Vdep (V) 65 R Bias Upper (MOhm) 1.39 R Bias Lower (MOhm) 1.26 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 36.88 20 50.38 30 57.95 40 63.76 50 68.51 60 72.75 70 76.98 80 81.5 90 86.01 100 90.33 110 94.34 120 98.18 130 101.7 140 105.14 150 108.55 160 111.72 170 114.87 180 117.97 190 120.95 200 123.85 210 126.78 220 129.56 230 132.3 240 134.99 250 137.7 260 140.32 270 142.89 280 145.47 290 147.98 300 150.45 310 152.98 320 155.38 330 157.79 340 160.25 350 162.6 #CV 10 15 O.L. 20 O.L. 25 2605.41 30 2247.9 35 1999.21 40 1812.83 45 1676.56 50 1579.94 55 1515.01 60 1473.65 65 1448.64 70 1434.6 75 1427 80 1422.77 85 1420.18 90 1418.37 95 1417.01 100 1415.83 105 1414.79 110 1414.04 115 1413.27 120 1412.47 #End of manufacturer data file