#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213888
Mfr serial number	STN14454-13888

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/04/2003
PROBLEM	NO
PASSED	YES
Run number	20220900213888

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.08467
I_LEAK350V (microA)	0.12665
Substr Origin	338
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	70
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.24

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	27.12
20	37.48
30	43.13
40	47.56
50	51.51
60	55.4
70	59.28
80	63.14
90	66.76
100	70.17
110	73.3
120	76.32
130	79.26
140	82.01
150	84.67
160	87.21
170	89.81
180	92.21
190	94.55
200	96.88
210	99.16
220	101.39
230	103.53
240	105.61
250	107.73
260	109.81
270	111.85
280	113.8
290	115.78
300	117.72
310	119.55
320	121.37
330	123.14
340	124.93
350	126.65
	
#CV	
10	
15	O.L.
20	O.L.
25	2750.95
30	2382.27
35	2121.9
40	1928.18
45	1778.43
50	1658.38
55	1564.95
60	1500.06
65	1462.8
70	1445
75	1437.2
80	1433.39
85	1431.08
90	1429.52
95	1428.31
100	1427.27
105	1426.29
110	1425.34
115	1424.64
120	1423.87

#End of manufacturer data file