#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900214000
Mfr serial number	STN14457-14000

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/04/2003
PROBLEM	NO
PASSED	YES
Run number	20220900214000

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.08894
I_LEAK350V (microA)	0.13148
Substr Origin	340
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.74
R Bias Lower (MOhm)	1.41

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.48
20	41.19
30	47.29
40	51.88
50	55.78
60	59.54
70	63.44
80	67.3
90	70.94
100	74.33
110	77.53
120	80.57
130	83.46
140	86.19
150	88.94
160	91.56
170	94.1
180	96.59
190	99.02
200	101.39
210	103.7
220	105.96
230	108.15
240	110.32
250	112.41
260	114.47
270	116.51
280	118.51
290	120.43
300	122.31
310	124.2
320	126.07
330	127.92
340	129.71
350	131.48
	
#CV	
10	
15	O.L.
20	O.L.
25	2612.08
30	2260.8
35	2012.79
40	1829.16
45	1687.15
50	1577.36
55	1499.42
60	1453.44
65	1431.31
70	1421.95
75	1417.65
80	1415.18
85	1413.45
90	1412.08
95	1410.86
100	1409.89
105	1409.05
110	1408.26
115	1407.7
120	1406.88

#End of manufacturer data file