#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202347
Mfr serial number	STN11174-02347

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202347

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10092
I_LEAK350V (microA)	0.14387
Substr Origin	081
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	75
R Bias Upper (MOhm)	1.58
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.46
20	49.52
30	57.08
40	62.45
50	66.98
60	71
70	74.96
80	78.86
90	82.5
100	85.97
110	89.29
120	92.43
130	95.4
140	98.21
150	100.92
160	103.51
170	105.99
180	108.48
190	110.86
200	113.23
210	115.5
220	117.75
230	119.94
240	122.12
250	124.28
260	126.4
270	128.42
280	130.47
290	132.45
300	134.43
310	136.41
320	138.31
330	140.19
340	142.06
350	143.87
	
#CV	
10	
15	O.L.
20	O.L.
25	2969.92
30	2559.46
35	2274.8
40	2059.3
45	1892.58
50	1760.88
55	1652.58
60	1566.35
65	1501.69
70	1459.5
75	1435.74
80	1423.51
85	1417.52
90	1414.46
95	1412.4
100	1410.92
105	1409.76
110	1408.8
115	1408.02
120	1407.05

#End of manufacturer data file