#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203452
Mfr serial number	STN11534-03452

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203452

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11721
I_LEAK350V (microA)	0.17346
Substr Origin	104
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	82																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.24
20	55.45
30	63.42
40	69.46
50	74.38
60	79.14
70	84.09
80	89.16
90	93.97
100	98.42
110	102.54
120	106.45
130	110.19
140	113.74
150	117.21
160	120.58
170	123.88
180	127.1
190	130.2
200	133.28
210	136.31
220	139.24
230	142.12
240	145.01
250	147.8
260	150.54
270	153.21
280	155.88
290	158.5
300	161.1
310	163.65
320	166.13
330	168.55
340	171.07
350	173.46
	
#CV	
10	
15	O.L.
20	O.L.
25	2505.33
30	2163.33
35	1925.25
40	1745.58
45	1610.96
50	1516.22
55	1460.87
60	1435.25
65	1424.27
70	1419.3
75	1416.5
80	1414.5
85	1412.88
90	1411.59
95	1410.48
100	1409.51
105	1408.55
110	1407.79
115	1407.05
120	1406.34

#End of manufacturer data file