#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203474
Mfr serial number	STN11535-03474

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203474

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12797
I_LEAK350V (microA)	0.1994
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.17
20	57.33
30	66.29
40	72.76
50	78.76
60	84.82
70	90.6
80	96.03
90	101.13
100	105.9
110	110.68
120	115.17
130	119.55
140	123.81
150	127.97
160	132.04
170	135.96
180	139.89
190	143.73
200	147.31
210	151.28
220	154.99
230	158.65
240	162.27
250	165.83
260	169.37
270	172.8
280	176.27
290	179.67
300	182.9
310	186.5
320	189.9
330	193.13
340	196.5
350	199.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2537.8
30	2189.51
35	1943.15
40	1761.07
45	1622.43
50	1522.22
55	1462.14
60	1433.96
65	1422.23
70	1416.99
75	1414.13
80	1412.2
85	1410.72
90	1409.53
95	1408.53
100	1407.61
105	1406.85
110	1406.26
115	1405.71
120	1405.15

#End of manufacturer data file