#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203477
Mfr serial number	STN11535-03477

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203477

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14045
I_LEAK350V (microA)	0.2078
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.24
20	70.84
30	80.26
40	86.94
50	92.63
60	98.66
70	104.37
80	109.7
90	114.67
100	119.39
110	123.87
120	128.16
130	132.36
140	136.44
150	140.45
160	144.35
170	147.9
180	151.83
190	155.49
200	159.1
210	162.66
220	166.16
230	169.61
240	173
250	176.29
260	179.56
270	182.7
280	186
290	189.15
300	192.3
310	195.4
320	198.51
330	201.6
340	204.7
350	207.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2486.12
30	2146.26
35	1904.96
40	1727.72
45	1594.96
50	1505.23
55	1456.3
60	1435.03
65	1426.42
70	1422.43
75	1420.04
80	1418.24
85	1416.89
90	1415.81
95	1414.75
100	1413.89
105	1413.21
110	1412.63
115	1412.03
120	1411.56

#End of manufacturer data file