#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203660
Mfr serial number	STN11543-03660

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203660

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10217
I_LEAK350V (microA)	0.14928
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.93
20	48.18
30	54.43
40	59.73
50	64.55
60	69.13
70	73.77
80	78.21
90	82.28
100	86.02
110	89.55
120	92.93
130	96.08
140	99.14
150	102.17
160	104.96
170	107.85
180	110.65
190	113.31
200	115.95
210	118.57
220	121.08
230	123.54
240	125.92
250	128.27
260	130.49
270	132.68
280	134.89
290	137.04
300	139.18
310	141.29
320	143.32
330	145.32
340	147.34
350	149.28
	
#CV	
10	
15	O.L.
20	O.L.
25	2573.06
30	2221.63
35	1974.8
40	1791.31
45	1650.57
50	1544.58
55	1476.19
60	1443
65	1429.81
70	1424.23
75	1421.14
80	1419.07
85	1417.48
90	1416.09
95	1414.95
100	1413.94
105	1413.04
110	1412.35
115	1411.54
120	1410.92

#End of manufacturer data file