#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203855
Mfr serial number	STN11622-03855

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203855

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.15819
I_LEAK350V (microA)	0.2473
Substr Origin	110
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	162																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.11
20	73.24
30	83.66
40	91.33
50	98.39
60	105.21
70	112.08
80	118.64
90	124.73
100	130.65
110	136.29
120	141.89
130	147.46
140	152.88
150	158.19
160	163.42
170	168.58
180	173.71
190	178.92
200	184
210	189.3
220	194.4
230	199.5
240	204.7
250	209.6
260	214.4
270	219
280	223.3
290	227.3
300	231.2
310	234.8
320	238.4
330	241.7
340	244.7
350	247.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2668.31
30	2301.66
35	2044.87
40	1850.6
45	1701.74
50	1586.72
55	1503.71
60	1456.29
65	1434.68
70	1425.87
75	1421.89
80	1419.4
85	1417.65
90	1416.24
95	1415.17
100	1414.22
105	1413.53
110	1412.78
115	1412.3
120	1411.81

#End of manufacturer data file