#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204027
Mfr serial number	STN11630-04027

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204027

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13908
I_LEAK350V (microA)	0.2189
Substr Origin	113
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.35
R Bias Lower (MOhm)	1.12

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.26
20	58.78
30	68
40	75.11
50	81.36
60	87.82
70	94.8
80	101.39
90	107.54
100	113.34
110	118.86
120	124.22
130	129.26
140	134.19
150	139.08
160	143.75
170	148.3
180	152.88
190	157.28
200	161.59
210	165.94
220	170.1
230	174.21
240	178.25
250	182.3
260	186.1
270	189.8
280	193.7
290	197.4
300	201
310	204.8
320	208.3
330	211.9
340	215.1
350	218.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2503.92
30	2162.44
35	1923.12
40	1744.12
45	1608.69
50	1511.67
55	1456
60	1432.13
65	1422.75
70	1418.37
75	1415.71
80	1413.75
85	1412.21
90	1410.9
95	1409.8
100	1408.83
105	1408.03
110	1407.25
115	1406.68
120	1405.97

#End of manufacturer data file