#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204485
Mfr serial number	STN11765-04485

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204485

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.121
I_LEAK350V (microA)	0.17768
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	483																																							
Pinhole	484																																							
Pinhole	485																																							
Pinhole	487																																							
Pinhole	491																																							
Pinhole	504																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	40.55
20	59.98
30	68.24
40	74.32
50	79.34
60	84.29
70	89.41
80	94.17
90	98.59
100	102.73
110	106.57
120	110.4
130	114.03
140	117.57
150	121
160	124.35
170	127.56
180	130.76
190	133.92
200	137.04
210	139.89
220	143.03
230	145.9
240	148.71
250	151.47
260	154.3
270	157.01
280	159.69
290	162.35
300	164.97
310	167.39
320	170.13
330	172.68
340	175.18
350	177.68
	
#CV	
10	
15	O.L.
20	O.L.
25	2654.12
30	2286.34
35	2028.74
40	1836.61
45	1690.61
50	1579.29
55	1500.85
60	1452.76
65	1427.39
70	1415.75
75	1410.4
80	1407.27
85	1405.56
90	1403.91
95	1402.59
100	1401.81
105	1400.78
110	1399.89
115	1399.3
120	1398.58

#End of manufacturer data file