#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204774
Mfr serial number	STN11777-04774

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204774

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14138
I_LEAK350V (microA)	0.2162
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	569																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.92
20	65.43
30	74.93
40	81.96
50	88.15
60	94.28
70	100.7
80	106.91
90	112.58
100	117.91
110	122.92
120	127.6
130	132.39
140	136.96
150	141.38
160	145.71
170	149.85
180	153.99
190	158.03
200	162.03
210	165.91
220	169.53
230	173.46
240	177.29
250	181.1
260	184.7
270	188.18
280	191.9
290	195.4
300	199
310	202.5
320	205.7
330	209.4
340	212.9
350	216.2
	
#CV	
10	
15	O.L.
20	2905.11
25	2384.88
30	2056.43
35	1827.97
40	1664.16
45	1553.53
50	1487.75
55	1454.16
60	1438.76
65	1431.4
70	1427.2
75	1424.49
80	1422.46
85	1420.78
90	1419.4
95	1418.15
100	1417.09
105	1416.07
110	1415.31
115	1414.45
120	1413.78

#End of manufacturer data file