#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208167
Mfr serial number	STN12564-08167

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208167

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08794
I_LEAK350V (microA)	0.13109
Substr Origin	239
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	70
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.57
20	41.1
30	46.84
40	51.34
50	55.13
60	58.71
70	62.3
80	65.95
90	69.57
100	73.07
110	76.34
120	79.44
130	82.39
140	85.22
150	87.94
160	90.56
170	93.04
180	95.53
190	97.92
200	100.3
210	102.63
220	104.87
230	107.07
240	109.25
250	111.39
260	113.48
270	115.5
280	117.54
290	119.56
300	121.55
310	123.5
320	125.41
330	127.33
340	129.24
350	131.09
	
#CV	
10	
15	O.L.
20	O.L.
25	2832.41
30	2443.31
35	2173.28
40	1968.03
45	1811.04
50	1687.39
55	1589.49
60	1519.19
65	1474.23
70	1449.72
75	1437.99
80	1432.41
85	1429.38
90	1427.35
95	1425.73
100	1424.62
105	1423.44
110	1422.48
115	1421.74
120	1420.91

#End of manufacturer data file