#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208350
Mfr serial number	STN12682-08350

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	07/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208350

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09544
I_LEAK350V (microA)	0.13865
Substr Origin	231
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	75
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.26
20	42.4
30	48.91
40	54.31
50	59.53
60	64.1
70	68.27
80	72.33
90	76.23
100	79.88
110	83.3
120	86.56
130	89.63
140	92.6
150	95.44
160	98.19
170	100.76
180	103.35
190	105.83
200	108.28
210	110.66
220	112.98
230	115.27
240	117.51
250	119.69
260	121.85
270	123.89
280	125.9
290	127.81
300	129.68
310	131.56
320	133.39
330	135.17
340	136.91
350	138.65
	
#CV	
10	
15	O.L.
20	O.L.
25	2945.49
30	2542.55
35	2258.13
40	2047.81
45	1885.26
50	1755.25
55	1649.76
60	1567.7
65	1509.33
70	1471.58
75	1450.4
80	1439.16
85	1433.28
90	1430.27
95	1428.24
100	1426.78
105	1425.87
110	1424.98
115	1424.11
120	1423.21

#End of manufacturer data file