#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208722
Mfr serial number	STN12627-08722

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	19/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208722

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08647
I_LEAK350V (microA)	0.1277
Substr Origin	238
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.7
R Bias Lower (MOhm)	1.55

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.31
20	41.15
30	46.7
40	50.97
50	54.87
60	58.64
70	62.28
80	65.74
90	69.07
100	72.36
110	75.48
120	78.41
130	81.19
140	83.87
150	86.47
160	88.97
170	91.34
180	93.73
190	96.05
200	98.33
210	100.53
220	102.72
230	104.83
240	106.95
250	109
260	111.01
270	112.95
280	114.92
290	116.84
300	118.73
310	120.62
320	122.44
330	124.23
340	125.97
350	127.7
	
#CV	
10	
15	O.L.
20	2955.63
25	2432.22
30	2099.64
35	1865.34
40	1697.29
45	1577.58
50	1501.2
55	1458.59
60	1438.07
65	1428.72
70	1424.28
75	1421.59
80	1419.67
85	1418.39
90	1417.07
95	1415.77
100	1414.7
105	1414.08
110	1413.19
115	1412.52
120	1411.62

#End of manufacturer data file