#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208837
Mfr serial number	STN12634-08837

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208837

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08246
I_LEAK350V (microA)	0.12253
Substr Origin	246
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	70
R Bias Upper (MOhm)	1.37
R Bias Lower (MOhm)	1.24

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.6
20	40.42
30	45.71
40	49.77
50	53.09
60	56.08
70	59.2
80	62.49
90	65.75
100	68.88
110	71.86
120	74.67
130	77.38
140	79.96
150	82.46
160	84.85
170	87.13
180	89.43
190	91.61
200	93.81
210	95.93
220	98.02
230	100.07
240	102.11
250	104.05
260	106
270	107.88
280	109.78
290	111.7
300	113.57
310	115.41
320	117.22
330	119
340	120.78
350	122.53
	
#CV	
10	
15	O.L.
20	O.L.
25	2803.97
30	2419.16
35	2149.87
40	1948.21
45	1793.42
50	1670.81
55	1575.32
60	1506.82
65	1463.2
70	1439.04
75	1426.96
80	1421.16
85	1417.96
90	1416.02
95	1414.43
100	1413.22
105	1412.09
110	1411.22
115	1410.48
120	1409.65

#End of manufacturer data file