#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900210026
Mfr serial number	STN12914-10026

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/05/2002
PROBLEM	NO
PASSED	YES
Run number	20220900210026

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09418
I_LEAK350V (microA)	0.13715
Substr Origin	262
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.38
20	43.69
30	49.94
40	54.8
50	59.08
60	63.24
70	67.34
80	71.4
90	75.29
100	78.93
110	82.3
120	85.47
130	88.49
140	91.4
150	94.18
160	96.85
170	99.39
180	101.9
190	104.35
200	106.76
210	109.09
220	111.37
230	113.61
240	115.82
250	117.96
260	120.08
270	122.1
280	124.13
290	126.15
300	128.07
310	129.96
320	131.77
330	133.6
340	135.41
350	137.15
	
#CV	
10	
15	O.L.
20	O.L.
25	2921.83
30	2518.48
35	2235.06
40	2023.59
45	1861.22
50	1730.63
55	1626.07
60	1545.05
65	1487.18
70	1449.51
75	1427.71
80	1415.96
85	1409.96
90	1406.67
95	1404.66
100	1403.3
105	1402.19
110	1401.26
115	1400.5
120	1399.81

#End of manufacturer data file