#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900210032
Mfr serial number	STN12914-10032

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/05/2002
PROBLEM	NO
PASSED	YES
Run number	20220900210032

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09538
I_LEAK350V (microA)	0.137
Substr Origin	262
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	75
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.01
20	45.62
30	51.96
40	56.87
50	61.15
60	65.22
70	69.24
80	73.24
90	77.06
100	80.62
110	83.92
120	86.98
130	89.91
140	92.7
150	95.38
160	97.96
170	100.41
180	102.82
190	105.16
200	107.47
210	109.7
220	111.89
230	114.03
240	116.14
250	118.2
260	120.27
270	122.22
280	124.17
290	126.1
300	128.01
310	129.9
320	131.76
330	133.58
340	135.3
350	137
	
#CV	
10	
15	O.L.
20	O.L.
25	2895.08
30	2496.2
35	2215.76
40	2006.57
45	1845.79
50	1716.74
55	1613.76
60	1535.16
65	1480.3
70	1445.51
75	1425.41
80	1414.54
85	1408.81
90	1405.62
95	1403.72
100	1402.41
105	1401.31
110	1400.41
115	1399.64
120	1399.05

#End of manufacturer data file