#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211887
Mfr serial number	STN13454-11887

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211887

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09674
I_LEAK350V (microA)	0.14622
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.03
20	43.7
30	50.4
40	55.72
50	60.35
60	64.61
70	68.75
80	72.8
90	76.72
100	80.43
110	83.99
120	87.43
130	90.64
140	93.7
150	96.74
160	99.81
170	102.67
180	105.52
190	108.24
200	110.93
210	113.64
220	116.23
230	118.73
240	121.23
250	123.66
260	126.1
270	128.45
280	130.77
290	133.05
300	135.32
310	137.57
320	139.76
330	141.94
340	144.16
350	146.22
	
#CV	
10	
15	O.L.
20	O.L.
25	2877.97
30	2479.98
35	2200.63
40	1992.28
45	1832.65
50	1706.14
55	1606.27
60	1532.09
65	1480.84
70	1448.35
75	1429.45
80	1419.24
85	1414.06
90	1411.08
95	1409.23
100	1407.95
105	1406.91
110	1405.89
115	1405.09
120	1404.43

#End of manufacturer data file