#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212667
Mfr serial number	STN13602-12667

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212667

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.12624
I_LEAK350V (microA)	0.1899
Substr Origin	317
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.32
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.39
20	57.5
30	66.43
40	74
50	80.49
60	85.91
70	90.89
80	95.86
90	100.77
100	105.5
110	109.95
120	114.25
130	118.43
140	122.36
150	126.24
160	129.99
170	133.72
180	137.33
190	140.82
200	144.28
210	147.7
220	151
230	154.24
240	157.16
250	160.54
260	163.68
270	166.73
280	169.79
290	172.79
300	175.82
310	178.81
320	181.5
330	184.2
340	187.2
350	189.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2963.75
30	2552.68
35	2263.85
40	2048.68
45	1882.91
50	1750.45
55	1643.4
60	1559.37
65	1497.09
70	1456.47
75	1433
80	1421.01
85	1415.26
90	1412.24
95	1410.56
100	1409.21
105	1408.12
110	1407.43
115	1406.67
120	1405.92

#End of manufacturer data file