#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212979
Mfr serial number	STN13766-12979

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212979

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.09781
I_LEAK350V (microA)	0.14304
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	80
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.41

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.33
20	46.92
30	53.8
40	59.14
50	63.58
60	67.58
70	71.38
80	75.19
90	78.95
100	82.52
110	85.82
120	88.97
130	92.08
140	94.99
150	97.81
160	100.53
170	103.25
180	105.82
190	108.34
200	110.8
210	113.27
220	115.66
230	117.97
240	120.23
250	122.51
260	124.79
270	126.97
280	129.11
290	131.19
300	133.27
310	135.25
320	137.23
330	139.18
340	141.17
350	143.04
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2624.16
35	2328.66
40	2108.08
45	1937.91
50	1801.82
55	1690.96
60	1601.82
65	1534.19
70	1487.2
75	1458.22
80	1442.41
85	1434.47
90	1430.26
95	1428.23
100	1426.47
105	1425.33
110	1424.06
115	1423.32
120	1422.46

#End of manufacturer data file