#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900213000
Mfr serial number	STN13767-13000

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/11/2002
PROBLEM	NO
PASSED	YES
Run number	20220900213000

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.09572
I_LEAK350V (microA)	0.14047
Substr Origin	325
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.62
R Bias Lower (MOhm)	1.45

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.4
20	45.56
30	52.19
40	57.37
50	61.82
60	65.99
70	69.86
80	73.65
90	77.29
100	80.73
110	83.96
120	87.04
130	90
140	92.94
150	95.72
160	98.41
170	101.1
180	103.64
190	106.16
200	108.61
210	111.05
220	113.4
230	115.71
240	117.95
250	120.19
260	122.45
270	124.6
280	126.71
290	128.74
300	130.8
310	132.8
320	134.75
330	136.68
340	138.63
350	140.47
	
#CV	
10	
15	O.L.
20	O.L.
25	2886.64
30	2486.16
35	2204.45
40	1995.87
45	1834.81
50	1706.67
55	1604.33
60	1527.65
65	1475.64
70	1444.36
75	1427.7
80	1419.53
85	1415.45
90	1413.16
95	1411.64
100	1410.31
105	1409.39
110	1408.49
115	1407.83
120	1406.96

#End of manufacturer data file