#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	StreamDelay
%TEST_DATE	08/04/2002
%TEST_TIME	17:17:10
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	YES
%PROBLEM	NO
#
%RUN	3214
%SCAN	1
#
%HOST	
%T0	21.0	deg. C
%T1	21.0	deg. C
#
# link setting comment
0  16 - OK
1  16 - OK
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	FullBypassTest
%TEST_DATE	08/04/2002
%TEST_TIME	17:18:26
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	YES
%PROBLEM	NO
#
%RUN	3214
%SCAN	2
#
%HOST	
%T0	23.0	deg. C
%T1	22.0	deg. C
#
#NConfigs  37
#Vdd = 4.0 - 3.5
#
%M0->S1: 	3.5 V	(Minimal tested)
%M0->S2: 	3.5 V	(Minimal tested)
%S1->S2: 	3.5 V	(Minimal tested)
%S1->S3: 	3.5 V	(Minimal tested)
%S2->S3: 	3.5 V	(Minimal tested)
%S2->S4: 	3.5 V	(Minimal tested)
%S3->S4: 	3.5 V	(Minimal tested)
%S3->E5: 	3.5 V	(Minimal tested)
%S4->E5: 	3.5 V	(Minimal tested)
%E5->S9: 	3.5 V	(Minimal tested)
%M8->S9: 	3.5 V	(Minimal tested)
%M8->S10: 	3.5 V	(Minimal tested)
%S9->S10: 	3.5 V	(Minimal tested)
%S9->S11: 	3.5 V	(Minimal tested)
%S10->S11: 	3.5 V	(Minimal tested)
%S10->S12: 	3.5 V	(Minimal tested)
%S11->S12: 	3.5 V	(Minimal tested)
%S11->E13: 	3.5 V	(Minimal tested)
%S12->E13: 	3.5 V	(Minimal tested)
%E13->S1: 	3.5 V	(Minimal tested)
#
%DEFECTS
#name	bypass_link	Vdd_min
#No defects found!
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	RedundancyTest
%TEST_DATE	08/04/2002
%TEST_TIME	17:18:32
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	YES
%PROBLEM	NO
#
%RUN	3214
%SCAN	8
#
%HOST	
%T0	23.0	deg. C
%T1	23.0	deg. C
#
#RedundancyTest Summary - not for the database
#chip pass good stuck dead adr0 adr1 com0 com1 com
# 0  1  126    2    0    0    0    0    0    0
# 1  1  128    0    0    0    0    0    0    0
# 2  1  128    0    0    0    0    0    0    0
# 3  1  128    0    0    0    0    0    0    0
# 4  1  128    0    0    0    0    0    0    0
# 5  1  128    0    0    0    0    0    0    0
# 6  1  128    0    0    0    0    0    0    0
# 7  1  128    0    0    0    0    0    0    0
# 8  1  128    0    0    0    0    0    0    0
# 9  1  128    0    0    0    0    0    0    0
#10  1  128    0    0    0    0    0    0    0
#11  1  128    0    0    0    0    0    0    0
#
%DEFECTS
#name	chip
#No defects found!
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	PipelineTest
%TEST_DATE	08/04/2002
%TEST_TIME	17:18:37
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	NO
%PROBLEM	NO
#
%RUN	3214
%SCAN	9
#
%HOST	
%T0	23.0	deg. C
%T1	23.0	deg. C
#
#
%00_GOOD	120
%01_GOOD	128
%02_GOOD	128
%03_GOOD	128
%04_GOOD	128
%05_GOOD	128
%06_GOOD	128
%07_GOOD	128
%08_GOOD	128
%09_GOOD	128
%10_GOOD	128
%11_GOOD	128
#
%DEFECTS
#name	chan	cell
%DEADCELL	22	5
%DEADCELL	22	7
%DEADCELL	22	9
%DEADCELL	23	11
%DEADCELL	25	4
%DEADCELL	25	5
%DEADCELL	25	7
%DEADCELL	25	9
%DEADCELL	26	1
%DEADCELL	26	3
%DEADCELL	26	11
%DEADCELL	28	4
%DEADCELL	28	5
%DEADCELL	28	6
%DEADCELL	28	7
%DEADCELL	28	8
%DEADCELL	28	9
%DEADCELL	28	10
%STUCKCELL	29	1
%STUCKCELL	29	2
%STUCKCELL	29	3
%STUCKCELL	29	4
%STUCKCELL	29	5
%STUCKCELL	29	6
%STUCKCELL	29	7
%STUCKCELL	29	8
%STUCKCELL	29	9
%STUCKCELL	29	10
%STUCKCELL	29	11
%STUCKCELL	30	0
%STUCKCELL	30	1
%STUCKCELL	30	2
%STUCKCELL	30	3
%STUCKCELL	30	4
%STUCKCELL	30	5
%STUCKCELL	30	6
%STUCKCELL	30	7
%STUCKCELL	30	8
%STUCKCELL	30	9
%STUCKCELL	30	10
%STUCKCELL	30	11
%DEADCELL	32	1
%DEADCELL	32	2
%DEADCELL	32	3
%DEADCELL	32	11
#45 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	StrobeDelay
%TEST_DATE	08/04/2002
%TEST_TIME	17:20:47
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	YES
%PROBLEM	NO
#
%RUN	3214
%SCAN	12
#
%HOST	
%T0	25.0	deg. C
%T1	23.0	deg. C
#
#
#parameter	value
%00_DELAY	14
%01_DELAY	16
%02_DELAY	16
%03_DELAY	14
%04_DELAY	15
%05_DELAY	15
%06_DELAY	16
%07_DELAY	15
%08_DELAY	15
%09_DELAY	15
%10_DELAY	16
%11_DELAY	16
#
%DEFECTS
#name	chip
#No defects found!
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	ResponseCurve
%TEST_DATE	08/04/2002
%TEST_TIME	17:23:46
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	YES
%PROBLEM	NO
#
%RUN	3214
%SCAN	13
#
%HOST	
%T0	26.0	deg. C
%T1	26.0	deg. C
#
#
%N_SCANS	3
%Q_00	1.50 fC
%Q_01	2.00 fC
%Q_02	2.50 fC
%RC_FIT	4	(linear fit)
#
%ModuleResponseCurvePlot
#		func	p0	p1	p2
Chip  0:	4	14.09	55.62	0.00
Chip  1:	4	11.96	53.88	0.00
Chip  2:	4	10.48	55.08	0.00
Chip  3:	4	13.45	52.87	0.00
Chip  4:	4	11.17	53.38	0.00
Chip  5:	4	13.18	54.14	0.00
Chip  6:	4	14.23	56.27	0.00
Chip  7:	4	12.36	54.12	0.00
Chip  8:	4	12.28	54.29	0.00
Chip  9:	4	13.84	54.65	0.00
Chip 10:	4	13.39	53.54	0.00
Chip 11:	4	9.51	55.08	0.00
#
%ModuleGainOffsetNoise
#  at 2.00fC
#		vt50	rms	gain	rms	offset	rms	outnse	innse	rms	comment
Chip  0:	125.9	 8.58	55.6	4.03	 14.8	 6.99	6.94	  655	  65	partbonded
Chip  1:	119.9	 7.58	53.9	1.15	 12.5	 6.27	5.55	  644	  19	unbonded
Chip  2:	121.2	 8.07	54.1	4.81	 13.0	 6.82	5.54	  650	 124	unbonded
Chip  3:	119.1	 8.10	52.9	1.08	 14.4	 6.55	5.36	  634	  18	unbonded
Chip  4:	118.2	 7.00	53.4	0.90	 12.0	 6.12	5.45	  638	  17	unbonded
Chip  5:	121.3	 7.27	54.1	1.00	 13.7	 6.54	5.49	  634	  19	unbonded
Chip  6:	127.2	 6.90	56.3	1.23	 14.5	 6.51	5.74	  638	  20	unbonded
Chip  7:	120.7	 7.60	54.1	0.96	 13.5	 6.08	5.47	  632	  19	unbonded
Chip  8:	121.3	 7.09	54.3	0.91	 13.3	 6.59	5.49	  632	  18	unbonded
Chip  9:	123.1	 7.05	54.7	1.09	 14.0	 6.36	5.33	  610	  19	unbonded
Chip 10:	120.4	 7.59	53.5	1.27	 13.8	 6.76	5.51	  643	  22	unbonded
Chip 11:	119.9	 7.46	55.1	1.26	 10.9	 6.19	5.64	  640	  22	unbonded
#
#BadChannelSummary - not for the database
#  at 2.00fC
#		lost	dodgy	dead	stuck	ineff	unbon	lo_gn	hi_gn	lo_off	hi_off	partbon	hi_nse
#Chip  0:	122	  6	  0	  2	  2	120	  0	  0	  0	  0	  0	  6
#Chip  1:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  2:	127	  1	  0	  1	  0	126	  0	  0	  0	  0	  0	  1
#Chip  3:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  4:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  5:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  6:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  7:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  8:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  9:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip 10:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip 11:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Link  0:	761	  7	  0	  3	  2	758	  0	  0	  0	  0	  0	  7
#Link  1:	768	  0	  0	  0	  0	768	  0	  0	  0	  0	  0	  0
#Link  2:	1529	  7	  0	  3	  2	1526	  0	  0	  0	  0	  0	  7
#
%DEFECTS
#name	channel	value
%UNBONDED	0	681.38
%UNBONDED	1	674.86
%UNBONDED	2	704.46
%UNBONDED	3	650.48
%UNBONDED	4	665.71
%UNBONDED	5	654.96
%UNBONDED	6	676.08
%UNBONDED	7	658.11
%UNBONDED	8	689.26
%UNBONDED	9	674.26
%UNBONDED	10	659.76
%UNBONDED	11	647.56
%UNBONDED	12	664.79
%UNBONDED	13	638.31
%UNBONDED	14	709.33
%UNBONDED	15	654.39
%UNBONDED	16	668.69
%UNBONDED	17	622.30
%UNBONDED	18	641.33
%UNBONDED	19	678.44
%UNBONDED	20	681.04
%UNBONDED	21	657.35
%NOISY	22	3389.19
%NOISY	23	1326.90
%UNBONDED	24	651.84
%NOISY	25	4701.42
%NOISY	26	3670.78
%UNBONDED	27	618.36
%NOISY	28	9425.31
%STUCK	29
%STUCK	30
%UNBONDED	31	615.13
%NOISY	32	7305.89
%UNBONDED	33	657.75
%UNBONDED	34	671.76
%UNBONDED	35	670.19
%UNBONDED	36	653.70
%UNBONDED	37	626.46
%UNBONDED	38	662.89
%UNBONDED	39	631.13
%UNBONDED	40	678.10
%UNBONDED	41	685.75
%UNBONDED	42	644.78
%UNBONDED	43	663.59
%UNBONDED	44	671.31
%UNBONDED	45	642.75
%UNBONDED	46	653.50
%UNBONDED	47	636.08
%UNBONDED	48	657.25
%UNBONDED	49	624.96
%UNBONDED	50	654.99
%UNBONDED	51	650.06
%UNBONDED	52	688.36
%UNBONDED	53	627.61
%UNBONDED	54	650.49
%UNBONDED	55	661.87
%UNBONDED	56	661.41
%UNBONDED	57	654.52
%UNBONDED	58	703.45
%UNBONDED	59	629.69
%UNBONDED	60	630.55
%UNBONDED	61	655.88
%UNBONDED	62	626.50
%UNBONDED	63	647.46
%UNBONDED	64	673.01
%UNBONDED	65	637.29
%UNBONDED	66	615.90
%UNBONDED	67	637.89
%UNBONDED	68	686.24
%UNBONDED	69	620.54
%UNBONDED	70	657.01
%UNBONDED	71	640.07
%UNBONDED	72	621.40
%UNBONDED	73	635.17
%UNBONDED	74	686.52
%UNBONDED	75	635.58
%UNBONDED	76	672.53
%UNBONDED	77	673.88
%UNBONDED	78	656.04
%UNBONDED	79	616.37
%UNBONDED	80	662.14
%UNBONDED	81	653.40
%UNBONDED	82	630.85
%UNBONDED	83	642.43
%UNBONDED	84	635.50
%UNBONDED	85	631.07
%UNBONDED	86	641.29
%UNBONDED	87	625.51
%UNBONDED	88	638.00
%UNBONDED	89	593.94
%UNBONDED	90	635.74
%UNBONDED	91	621.30
%UNBONDED	92	647.52
%UNBONDED	93	622.81
%UNBONDED	94	619.88
%UNBONDED	95	653.66
%UNBONDED	96	664.00
%UNBONDED	97	627.13
%UNBONDED	98	628.88
%UNBONDED	99	652.74
%UNBONDED	100	641.34
%UNBONDED	101	642.87
%UNBONDED	102	658.08
%UNBONDED	103	631.65
%UNBONDED	104	641.50
%UNBONDED	105	626.01
%UNBONDED	106	648.32
%UNBONDED	107	630.77
%UNBONDED	108	627.14
%UNBONDED	109	630.40
%UNBONDED	110	662.99
%UNBONDED	111	619.01
%UNBONDED	112	626.72
%UNBONDED	113	649.55
%UNBONDED	114	657.40
%UNBONDED	115	641.54
%UNBONDED	116	665.63
%UNBONDED	117	678.07
%UNBONDED	118	639.43
%UNBONDED	119	642.41
%UNBONDED	120	662.13
%UNBONDED	121	621.18
%UNBONDED	122	657.60
%UNBONDED	123	674.58
%UNBONDED	124	654.97
%UNBONDED	125	605.95
%UNBONDED	126	641.78
%UNBONDED	127	648.25
%STUCK	300
%NOISY	372	2019.97
#130 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	TrimScan
%TEST_DATE	08/04/2002
%TEST_TIME	17:47:49
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
%PASS   	NO
%PROBLEM	NO
#
%RUN	3214
%SCAN	16
#
%HOST	
%T0	27.0	deg. C
%T1	27.0	deg. C
#
%TRIM_TYPE	0
%TRIM_Q	10.0
%N_SCANS	16
%T_00	0
%T_01	1
%T_02	2
%T_03	3
%T_04	4
%T_05	5
%T_06	6
%T_07	7
%T_08	8
%T_09	9
%T_10	10
%T_11	11
%T_12	12
%T_13	13
%T_14	14
%T_15	15
%TRIM_ALGORITHM	0
#(trim whole module)
#
%TRIM_FILE	D:\sctvar\results\20220170200039hDaqIN_tr0_20020408.trim
%MASK_FILE	D:\sctvar\results\20220170200039hDaqIN_tr0_20020408.mask
#
%TrimSummary
#
#		range	target	ntrim	vt50	vt50rms	tr_off	off_rms	tr_step	step_rms
Chip  0:	0	87.5	126	 87.2	 1.33	-18.8	 2.5	 3.66	 0.16
Chip  1:	0	87.5	128	 86.9	 1.04	-19.1	 2.2	 3.44	 0.15
Chip  2:	0	87.5	126	 86.9	 1.01	-19.8	 2.7	 3.29	 0.15
Chip  3:	0	87.5	128	 87.1	 1.17	-18.4	 2.6	 3.53	 0.14
Chip  4:	0	87.5	128	 87.0	 1.02	-19.2	 2.1	 3.32	 0.13
Chip  5:	0	87.5	128	 87.2	 1.09	-19.0	 2.3	 3.46	 0.13
Chip  6:	0	87.5	128	 86.9	 1.14	-20.6	 1.9	 3.40	 0.16
Chip  7:	0	87.5	128	 87.0	 1.11	-18.5	 2.3	 3.55	 0.15
Chip  8:	0	87.5	127	 87.1	 1.15	-17.1	 2.6	 3.81	 0.13
Chip  9:	0	87.5	128	 87.4	 1.17	-17.5	 2.0	 3.83	 0.15
Chip 10:	0	87.5	128	 87.2	 1.32	-18.9	 2.5	 3.46	 0.16
Chip 11:	0	87.5	128	 87.0	 1.15	-19.3	 2.5	 3.32	 0.20
#
%DEFECTS
#name	channel	value
%TR_OFFSET	28	-9.08
%TR_STEP	252	3.92
%TR_STEP	255	3.93
%TR_OFFSET	372	-6.28
%TR_STEP	383	3.81
%TR_OFFSET	79	-27.73
%TR_STEP	252	4.21
%TR_OFFSET	353	2.05
%TR_STEP	503	3.19
%TR_OFFSET	519	-27.92
%TR_OFFSET	557	-27.46
%TR_STEP	634	3.96
%TR_STEP	761	3.94
#13 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	TrimScan
%TEST_DATE	08/04/2002
%TEST_TIME	17:47:49
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
%PASS   	NO
%PROBLEM	NO
#
%RUN	3214
%SCAN	32
#
%HOST	
%T0	27.0	deg. C
%T1	27.0	deg. C
#
%TRIM_TYPE	1
%TRIM_Q	10.0
%N_SCANS	4
%T_00	3
%T_01	7
%T_02	11
%T_03	15
%TRIM_ALGORITHM	0
#(trim whole module)
#
%TRIM_FILE	D:\sctvar\results\20220170200039hDaqIN_tr1_20020408.trim
%MASK_FILE	D:\sctvar\results\20220170200039hDaqIN_tr1_20020408.mask
#
%TrimSummary
#
#		range	target	ntrim	vt50	vt50rms	tr_off	off_rms	tr_step	step_rms
Chip  0:	1	92.5	126	 92.0	 2.02	-9.7	 1.3	 7.12	 0.31
Chip  1:	1	92.5	128	 91.8	 1.86	-9.6	 1.1	 6.83	 0.29
Chip  2:	1	92.5	127	 91.6	 1.85	-10.0	 1.3	 6.52	 0.28
Chip  3:	1	92.5	128	 92.0	 1.89	-9.5	 1.3	 6.84	 0.24
Chip  4:	1	92.5	128	 92.2	 1.80	-9.8	 1.1	 6.53	 0.23
Chip  5:	1	92.5	128	 92.3	 1.81	-9.8	 1.1	 6.72	 0.24
Chip  6:	1	92.5	128	 92.0	 1.94	-10.5	 1.1	 6.67	 0.28
Chip  7:	1	92.5	128	 91.9	 1.92	-9.6	 1.2	 6.85	 0.26
Chip  8:	1	92.5	128	 91.9	 1.89	-9.1	 1.4	 7.16	 0.25
Chip  9:	1	92.5	128	 92.0	 2.15	-9.2	 1.0	 7.25	 0.28
Chip 10:	1	92.5	128	 92.2	 1.79	-9.8	 1.2	 6.72	 0.30
Chip 11:	1	92.5	128	 91.9	 1.64	-9.8	 1.3	 6.57	 0.35
#
%DEFECTS
#name	channel	value
%TR_OFFSET	28	-4.34
%TR_STEP	252	7.75
%TR_OFFSET	372	-3.59
%TR_STEP	383	7.38
%TR_OFFSET	509	-13.42
%TR_STEP	516	7.27
%TR_OFFSET	523	-13.31
%TR_OFFSET	79	-14.67
%TR_STEP	127	7.53
%TR_STEP	199	6.04
%TR_STEP	226	6.00
%TR_STEP	252	7.91
%TR_OFFSET	353	1.32
%TR_STEP	503	6.31
%TR_OFFSET	519	-13.78
%TR_OFFSET	557	-13.96
%TR_STEP	634	7.75
%TR_STEP	761	7.73
#18 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	TrimScan
%TEST_DATE	08/04/2002
%TEST_TIME	17:47:49
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
%PASS   	NO
%PROBLEM	NO
#
%RUN	3214
%SCAN	36
#
%HOST	
%T0	27.0	deg. C
%T1	27.0	deg. C
#
%TRIM_TYPE	2
%TRIM_Q	10.0
%N_SCANS	4
%T_00	3
%T_01	7
%T_02	11
%T_03	15
%TRIM_ALGORITHM	0
#(trim whole module)
#
%TRIM_FILE	D:\sctvar\results\20220170200039hDaqIN_tr2_20020408.trim
%MASK_FILE	D:\sctvar\results\20220170200039hDaqIN_tr2_20020408.mask
#
%TrimSummary
#
#		range	target	ntrim	vt50	vt50rms	tr_off	off_rms	tr_step	step_rms
Chip  0:	2	115.0	126	115.4	 3.12	-6.5	 0.8	10.65	 0.44
Chip  1:	2	115.0	128	114.4	 2.78	-6.3	 0.8	10.31	 0.40
Chip  2:	2	115.0	127	115.1	 2.79	-6.7	 0.9	 9.79	 0.40
Chip  3:	2	115.0	128	115.3	 2.88	-6.4	 0.8	10.20	 0.35
Chip  4:	2	115.0	128	114.9	 2.89	-6.5	 0.7	 9.81	 0.34
Chip  5:	2	115.0	128	115.0	 2.82	-6.5	 0.7	10.00	 0.35
Chip  6:	2	115.0	128	114.4	 2.74	-7.0	 0.7	10.03	 0.40
Chip  7:	2	115.0	128	115.2	 3.01	-6.4	 0.8	10.15	 0.36
Chip  8:	2	115.0	128	114.5	 2.74	-6.1	 0.9	10.58	 0.36
Chip  9:	2	115.0	128	114.9	 3.13	-6.2	 0.7	10.69	 0.39
Chip 10:	2	115.0	128	114.3	 2.66	-6.5	 0.8	10.06	 0.42
Chip 11:	2	115.0	128	115.4	 2.72	-6.5	 0.8	 9.83	 0.48
#
%DEFECTS
#name	channel	value
%TR_OFFSET	28	-3.05
%TR_STEP	252	11.64
%TR_OFFSET	372	-1.86
%TR_STEP	383	11.08
%TR_STEP	387	11.30
%TR_OFFSET	509	-9.03
%TR_STEP	516	10.89
%TR_OFFSET	523	-8.97
%TR_OFFSET	79	-9.31
%TR_STEP	199	9.06
%TR_STEP	226	8.89
%TR_STEP	252	11.59
%TR_OFFSET	353	0.98
%TR_STEP	503	9.49
%TR_OFFSET	519	-9.09
%TR_OFFSET	557	-9.23
%TR_STEP	634	11.42
#17 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	TrimScan
%TEST_DATE	08/04/2002
%TEST_TIME	17:47:49
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
%PASS   	NO
%PROBLEM	NO
#
%RUN	3214
%SCAN	40
#
%HOST	
%T0	27.0	deg. C
%T1	27.0	deg. C
#
%TRIM_TYPE	3
%TRIM_Q	10.0
%N_SCANS	4
%T_00	3
%T_01	7
%T_02	11
%T_03	15
%TRIM_ALGORITHM	0
#(trim whole module)
#
%TRIM_FILE	D:\sctvar\results\20220170200039hDaqIN_tr3_20020408.trim
%MASK_FILE	D:\sctvar\results\20220170200039hDaqIN_tr3_20020408.mask
#
%TrimSummary
#
#		range	target	ntrim	vt50	vt50rms	tr_off	off_rms	tr_step	step_rms
Chip  0:	3	140.0	126	139.5	 4.05	-4.9	 0.6	14.11	 0.56
Chip  1:	3	140.0	128	140.7	 3.69	-4.8	 0.6	13.52	 0.51
Chip  2:	3	140.0	127	139.8	 3.50	-5.0	 0.6	12.99	 0.50
Chip  3:	3	140.0	128	140.1	 3.79	-4.8	 0.6	13.50	 0.47
Chip  4:	3	140.0	128	140.1	 3.77	-4.9	 0.5	13.00	 0.44
Chip  5:	3	140.0	128	139.6	 4.27	-4.9	 0.5	13.31	 0.45
Chip  6:	3	140.0	128	140.2	 3.52	-5.3	 0.6	13.28	 0.53
Chip  7:	3	140.0	128	140.0	 3.80	-4.9	 0.6	13.40	 0.46
Chip  8:	3	140.0	128	140.4	 3.99	-4.6	 0.7	13.93	 0.46
Chip  9:	3	140.0	128	139.8	 3.96	-4.7	 0.5	14.03	 0.47
Chip 10:	3	140.0	128	140.3	 3.75	-4.9	 0.6	13.32	 0.52
Chip 11:	3	140.0	128	140.2	 3.87	-4.9	 0.6	13.06	 0.61
#
%DEFECTS
#name	channel	value
%TR_OFFSET	28	-2.29
%TR_STEP	136	15.09
%TR_STEP	252	15.07
%TR_OFFSET	372	-1.73
%TR_STEP	383	14.54
%TR_STEP	387	14.94
%TR_OFFSET	509	-6.90
%TR_STEP	516	14.37
%TR_OFFSET	523	-6.70
%TR_OFFSET	79	-7.15
%TR_STEP	226	11.70
%TR_STEP	252	15.15
%TR_OFFSET	353	0.77
%TR_STEP	503	12.58
%TR_OFFSET	519	-6.89
%TR_OFFSET	557	-6.92
%TR_STEP	634	15.11
#17 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	TrimScan
%TEST_DATE	08/04/2002
%TEST_TIME	17:47:49
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
%PASS   	NO
%PROBLEM	NO
#
%RUN	3214
%SCAN	16
#
%HOST	
%T0	27.0	deg. C
%T1	27.0	deg. C
#
%TRIM_TYPE	-1
%TRIM_Q	10.0
%TRIM_ALGORITHM	0
#(trim whole module)
#
%TRIM_FILE	D:\sctvar\results\20220170200039hDaqIN_tr-1_20020408.trim
%MASK_FILE	D:\sctvar\results\20220170200039hDaqIN_tr-1_20020408.mask
#
%TrimSummary
#
#		range	target	ntrim	vt50	vt50rms	tr_off	off_rms	tr_step	step_rms
Chip  0:	0	87.5	126	 87.1	 1.08	-18.8	 2.5	 3.66	 0.16
Chip  1:	0	87.5	128	 87.1	 0.99	-19.1	 2.2	 3.44	 0.15
Chip  2:	1	87.5	127	 87.2	 1.99	-10.0	 1.3	 6.52	 0.28
Chip  3:	0	87.5	128	 87.0	 1.07	-18.4	 2.6	 3.53	 0.14
Chip  4:	0	87.5	128	 87.0	 0.98	-19.2	 2.1	 3.32	 0.13
Chip  5:	0	87.5	128	 87.1	 0.97	-19.0	 2.3	 3.46	 0.13
Chip  6:	0	87.5	128	 87.0	 0.94	-20.6	 1.9	 3.40	 0.16
Chip  7:	0	87.5	128	 87.0	 1.02	-18.5	 2.3	 3.55	 0.15
Chip  8:	1	87.5	128	 86.6	 2.16	-9.1	 1.4	 7.16	 0.25
Chip  9:	0	87.5	128	 87.2	 1.05	-17.5	 2.0	 3.83	 0.15
Chip 10:	0	87.5	128	 87.1	 1.13	-18.9	 2.5	 3.46	 0.16
Chip 11:	0	87.5	128	 86.9	 0.96	-19.3	 2.5	 3.32	 0.20
#
%DEFECTS
#name	channel	value
%TR_OFFSET	28	-9.08
%TR_STEP	252	3.92
%TR_STEP	255	3.93
%TR_OFFSET	372	-3.59
%TR_STEP	383	7.38
%TR_OFFSET	79	-27.73
%TR_STEP	252	4.21
%TR_OFFSET	353	1.32
%TR_STEP	503	3.19
%TR_OFFSET	519	-27.92
%TR_OFFSET	557	-27.46
%TR_STEP	634	3.96
%TR_STEP	761	3.94
#13 defects found
#
%NEW_TEST
#
%SERIAL_NO	20220170200039hDaqIN
%TEST_NAME	ResponseCurve
%TEST_DATE	08/04/2002
%TEST_TIME	17:58:14
%LOCN_NAME	KEKFUJIB2
%INITLS	Administrator
#
%PASS   	YES
%PROBLEM	NO
#
%RUN	3214
%SCAN	44
#
%HOST	
%T0	27.0	deg. C
%T1	27.0	deg. C
#
#
%N_SCANS	10
%Q_00	0.50 fC
%Q_01	0.75 fC
%Q_02	1.00 fC
%Q_03	1.25 fC
%Q_04	1.50 fC
%Q_05	2.00 fC
%Q_06	3.00 fC
%Q_07	4.00 fC
%Q_08	6.00 fC
%Q_09	8.00 fC
%RC_FIT	3	(exponential fit)
#
%ModuleResponseCurvePlot
#		func	p0	p1	p2
Chip  0:	3	1477.64	6.30	-710.44
Chip  1:	3	1481.37	6.68	-709.03
Chip  2:	3	1447.24	6.33	-693.65
Chip  3:	3	1420.99	6.42	-678.78
Chip  4:	3	1463.08	6.67	-699.33
Chip  5:	3	1478.12	6.46	-709.42
Chip  6:	3	1453.95	6.23	-698.18
Chip  7:	3	1510.75	6.74	-724.59
Chip  8:	3	1551.67	6.85	-746.09
Chip  9:	3	1446.89	6.34	-693.34
Chip 10:	3	1553.60	6.92	-746.08
Chip 11:	3	1383.75	6.15	-660.70
#
%ModuleGainOffsetNoise
#  at 2.00fC
#		vt50	rms	gain	rms	offset	rms	outnse	innse	rms	comment
Chip  0:	144.6	 1.69	57.3	0.99	 28.2	 1.55	5.99	  654	  68	unbonded
Chip  1:	141.6	 1.61	54.2	1.06	 31.6	 1.44	5.62	  647	  18	unbonded
Chip  2:	142.9	 2.49	55.6	1.24	 30.5	 5.52	5.57	  625	  59	unbonded
Chip  3:	141.1	 1.43	54.1	1.09	 31.6	 1.74	5.46	  631	  21	unbonded
Chip  4:	141.3	 1.33	53.7	0.92	 32.1	 1.53	5.46	  635	  18	unbonded
Chip  5:	142.4	 1.45	55.9	1.07	 29.5	 1.53	5.54	  619	  18	unbonded
Chip  6:	144.7	 1.62	56.9	1.25	 28.8	 1.69	5.64	  620	  20	unbonded
Chip  7:	142.0	 1.36	54.9	0.93	 30.7	 1.43	5.48	  624	  19	unbonded
Chip  8:	141.9	 2.43	55.5	0.96	 29.6	 2.64	5.44	  612	  19	unbonded
Chip  9:	143.0	 1.70	55.7	1.09	 30.0	 1.70	5.43	  609	  19	unbonded
Chip 10:	141.6	 1.80	55.0	1.30	 30.6	 1.93	5.72	  650	  21	unbonded
Chip 11:	143.2	 1.65	54.9	1.29	 31.1	 1.77	5.47	  623	  18	unbonded
#
#BadChannelSummary - not for the database
#  at 2.00fC
#		lost	dodgy	dead	stuck	ineff	unbon	lo_gn	hi_gn	lo_off	hi_off	partbon	hi_nse
#Chip  0:	127	  1	  5	  2	  1	120	  0	  0	  0	  0	  0	  1
#Chip  1:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  2:	128	  0	  1	  0	  0	127	  1	  0	  0	  0	  0	  0
#Chip  3:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  4:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  5:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  6:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  7:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  8:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip  9:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip 10:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Chip 11:	128	  0	  0	  0	  0	128	  0	  0	  0	  0	  0	  0
#Link  0:	767	  1	  6	  2	  1	759	  1	  0	  0	  0	  0	  1
#Link  1:	768	  0	  0	  0	  0	768	  0	  0	  0	  0	  0	  0
#Link  2:	1535	  1	  6	  2	  1	1527	  1	  0	  0	  0	  0	  1
#
%DEFECTS
#name	channel	value
%DEAD	22
%NOISY	23	1369.80
%DEAD	25
%DEAD	26
%DEAD	28
%STUCK	29
%STUCK	30
%DEAD	32
%DEAD	300
#9 defects found