# 25deg.C Vdd=4.2V %NEW_TEST # %SERIAL_NO 20220170200039htestDaqIN %TEST_NAME RedundancyTest %TEST_DATE 12/04/2002 %TEST_TIME 15:15:58 %LOCN_NAME KEKFUJIB2 %INITLS Administrator # %PASS YES %PROBLEM NO # %RUN 5667 %SCAN 1 # %HOST %T0 29.0 deg. C %T1 28.0 deg. C # #RedundancyTest Summary - not for the database #chip pass good stuck dead adr0 adr1 com0 com1 com # 0 1 126 2 0 0 0 0 0 0 # 1 1 128 0 0 0 0 0 0 0 # 2 1 128 0 0 0 0 0 0 0 # 3 1 128 0 0 0 0 0 0 0 # 4 1 128 0 0 0 0 0 0 0 # 5 1 128 0 0 0 0 0 0 0 # 6 1 128 0 0 0 0 0 0 0 # 7 1 128 0 0 0 0 0 0 0 # 8 1 128 0 0 0 0 0 0 0 # 9 1 128 0 0 0 0 0 0 0 #10 1 128 0 0 0 0 0 0 0 #11 1 128 0 0 0 0 0 0 0 # %DEFECTS #name chip #No defects found! # %NEW_TEST # %SERIAL_NO 20220170200039htestDaqIN %TEST_NAME PipelineTest %TEST_DATE 12/04/2002 %TEST_TIME 15:16:19 %LOCN_NAME KEKFUJIB2 %INITLS Administrator # %PASS NO %PROBLEM NO # %RUN 5667 %SCAN 2 # %HOST %T0 29.0 deg. C %T1 28.0 deg. C # # %00_GOOD 120 %01_GOOD 128 %02_GOOD 128 %03_GOOD 128 %04_GOOD 128 %05_GOOD 128 %06_GOOD 128 %07_GOOD 128 %08_GOOD 128 %09_GOOD 128 %10_GOOD 128 %11_GOOD 128 # %DEFECTS #name chan cell %DEADCELL 22 5 %DEADCELL 22 7 %DEADCELL 22 9 %DEADCELL 23 11 %DEADCELL 25 4 %DEADCELL 25 5 %DEADCELL 25 6 %DEADCELL 25 7 %DEADCELL 25 9 %DEADCELL 26 1 %DEADCELL 26 3 %DEADCELL 26 11 %DEADCELL 28 4 %DEADCELL 28 5 %DEADCELL 28 6 %DEADCELL 28 7 %DEADCELL 28 8 %DEADCELL 28 9 %DEADCELL 28 10 %STUCKCELL 29 1 %STUCKCELL 29 2 %STUCKCELL 29 3 %STUCKCELL 29 4 %STUCKCELL 29 5 %STUCKCELL 29 6 %STUCKCELL 29 7 %STUCKCELL 29 8 %STUCKCELL 29 9 %STUCKCELL 29 10 %STUCKCELL 29 11 %STUCKCELL 30 0 %STUCKCELL 30 1 %STUCKCELL 30 2 %STUCKCELL 30 3 %STUCKCELL 30 4 %STUCKCELL 30 5 %STUCKCELL 30 6 %STUCKCELL 30 7 %STUCKCELL 30 8 %STUCKCELL 30 9 %STUCKCELL 30 10 %STUCKCELL 30 11 %DEADCELL 32 1 %DEADCELL 32 2 %DEADCELL 32 3 %DEADCELL 32 11 #46 defects found # # 5deg.C Vdd=4.0V %NEW_TEST # %SERIAL_NO 20220170200039htestDaqIN %TEST_NAME PipelineTest %TEST_DATE 12/04/2002 %TEST_TIME 15:38:28 %LOCN_NAME KEKFUJIB2 %INITLS Administrator # %PASS NO %PROBLEM NO # %RUN 5667 %SCAN 4 # %HOST %T0 14.0 deg. C %T1 12.0 deg. C # # %00_GOOD 120 %01_GOOD 128 %02_GOOD 128 %03_GOOD 128 %04_GOOD 128 %05_GOOD 128 %06_GOOD 128 %07_GOOD 128 %08_GOOD 128 %09_GOOD 128 %10_GOOD 128 %11_GOOD 128 # %DEFECTS #name chan cell %DEADCELL 22 5 %DEADCELL 22 7 %DEADCELL 22 9 %DEADCELL 23 11 %DEADCELL 25 5 %DEADCELL 25 7 %DEADCELL 25 9 %DEADCELL 26 1 %DEADCELL 26 3 %DEADCELL 26 11 %DEADCELL 28 4 %DEADCELL 28 5 %DEADCELL 28 6 %DEADCELL 28 7 %DEADCELL 28 8 %DEADCELL 28 9 %DEADCELL 28 10 %STUCKCELL 29 1 %STUCKCELL 29 2 %STUCKCELL 29 3 %STUCKCELL 29 4 %STUCKCELL 29 5 %STUCKCELL 29 6 %STUCKCELL 29 7 %STUCKCELL 29 8 %STUCKCELL 29 9 %STUCKCELL 29 10 %STUCKCELL 29 11 %STUCKCELL 30 0 %STUCKCELL 30 1 %STUCKCELL 30 2 %STUCKCELL 30 3 %STUCKCELL 30 4 %STUCKCELL 30 5 %STUCKCELL 30 6 %STUCKCELL 30 7 %STUCKCELL 30 8 %STUCKCELL 30 9 %STUCKCELL 30 10 %STUCKCELL 30 11 %DEADCELL 32 1 %DEADCELL 32 2 %DEADCELL 32 3 %DEADCELL 32 11 #44 defects found # %NEW_TEST # %SERIAL_NO 20220170200039htestDaqIN %TEST_NAME PipelineTest %TEST_DATE 12/04/2002 %TEST_TIME 15:38:44 %LOCN_NAME KEKFUJIB2 %INITLS Administrator # %PASS NO %PROBLEM NO # %RUN 5667 %SCAN 6 # %HOST %T0 19.0 deg. C %T1 17.0 deg. C # # %00_GOOD 120 %01_GOOD 128 %02_GOOD 128 %03_GOOD 128 %04_GOOD 128 %05_GOOD 128 %06_GOOD 128 %07_GOOD 128 %08_GOOD 128 %09_GOOD 128 %10_GOOD 128 %11_GOOD 128 # %DEFECTS #name chan cell %DEADCELL 22 5 %DEADCELL 22 7 %DEADCELL 22 9 %DEADCELL 23 11 %DEADCELL 25 4 %DEADCELL 25 5 %DEADCELL 25 7 %DEADCELL 25 9 %DEADCELL 26 1 %DEADCELL 26 3 %DEADCELL 26 11 %DEADCELL 28 4 %DEADCELL 28 5 %DEADCELL 28 6 %DEADCELL 28 7 %DEADCELL 28 8 %DEADCELL 28 9 %DEADCELL 28 10 %STUCKCELL 29 1 %STUCKCELL 29 2 %STUCKCELL 29 3 %STUCKCELL 29 4 %STUCKCELL 29 5 %STUCKCELL 29 6 %STUCKCELL 29 7 %STUCKCELL 29 8 %STUCKCELL 29 9 %STUCKCELL 29 10 %STUCKCELL 29 11 %STUCKCELL 30 0 %STUCKCELL 30 1 %STUCKCELL 30 2 %STUCKCELL 30 3 %STUCKCELL 30 4 %STUCKCELL 30 5 %STUCKCELL 30 6 %STUCKCELL 30 7 %STUCKCELL 30 8 %STUCKCELL 30 9 %STUCKCELL 30 10 %STUCKCELL 30 11 %DEADCELL 32 1 %DEADCELL 32 2 %DEADCELL 32 3 %DEADCELL 32 11 #45 defects found # # 5deg.C Vdd=4.2V %NEW_TEST # %SERIAL_NO 20220170200039htestDaqIN %TEST_NAME RedundancyTest %TEST_DATE 12/04/2002 %TEST_TIME 15:39:55 %LOCN_NAME KEKFUJIB2 %INITLS Administrator # %PASS YES %PROBLEM NO # %RUN 5667 %SCAN 8 # %HOST %T0 22.0 deg. C %T1 20.0 deg. C # #RedundancyTest Summary - not for the database #chip pass good stuck dead adr0 adr1 com0 com1 com # 0 1 126 2 0 0 0 0 0 0 # 1 1 128 0 0 0 0 0 0 0 # 2 1 128 0 0 0 0 0 0 0 # 3 1 128 0 0 0 0 0 0 0 # 4 1 128 0 0 0 0 0 0 0 # 5 1 128 0 0 0 0 0 0 0 # 6 1 128 0 0 0 0 0 0 0 # 7 1 128 0 0 0 0 0 0 0 # 8 1 128 0 0 0 0 0 0 0 # 9 1 128 0 0 0 0 0 0 0 #10 1 128 0 0 0 0 0 0 0 #11 1 128 0 0 0 0 0 0 0 # %DEFECTS #name chip #No defects found! # %NEW_TEST # %SERIAL_NO 20220170200039htestDaqIN %TEST_NAME PipelineTest %TEST_DATE 12/04/2002 %TEST_TIME 15:40:04 %LOCN_NAME KEKFUJIB2 %INITLS Administrator # %PASS NO %PROBLEM NO # %RUN 5667 %SCAN 9 # %HOST %T0 21.0 deg. C %T1 20.0 deg. C # # %00_GOOD 120 %01_GOOD 128 %02_GOOD 128 %03_GOOD 128 %04_GOOD 128 %05_GOOD 128 %06_GOOD 128 %07_GOOD 128 %08_GOOD 128 %09_GOOD 128 %10_GOOD 128 %11_GOOD 128 # %DEFECTS #name chan cell %DEADCELL 22 5 %DEADCELL 22 7 %DEADCELL 22 9 %DEADCELL 23 11 %DEADCELL 25 4 %DEADCELL 25 5 %DEADCELL 25 7 %DEADCELL 25 9 %DEADCELL 26 1 %DEADCELL 26 3 %DEADCELL 26 11 %DEADCELL 28 4 %DEADCELL 28 5 %DEADCELL 28 6 %DEADCELL 28 7 %DEADCELL 28 8 %DEADCELL 28 9 %DEADCELL 28 10 %STUCKCELL 29 1 %STUCKCELL 29 2 %STUCKCELL 29 3 %STUCKCELL 29 4 %STUCKCELL 29 5 %STUCKCELL 29 6 %STUCKCELL 29 7 %STUCKCELL 29 8 %STUCKCELL 29 9 %STUCKCELL 29 10 %STUCKCELL 29 11 %STUCKCELL 30 0 %STUCKCELL 30 1 %STUCKCELL 30 2 %STUCKCELL 30 3 %STUCKCELL 30 4 %STUCKCELL 30 5 %STUCKCELL 30 6 %STUCKCELL 30 7 %STUCKCELL 30 8 %STUCKCELL 30 9 %STUCKCELL 30 10 %STUCKCELL 30 11 %DEADCELL 32 1 %DEADCELL 32 2 %DEADCELL 32 3 %DEADCELL 32 11 #45 defects found